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TITLE: TRANSMISSION ELECTRON MICROSCOPY AND DIFFRACTOMETRY
OF MATERIALS, 4TH EDITION
PUBLISHER: SPRINGER LANGUAGE: ENGLISH
LINK: http://is.gd/Zr6FAc RELEASE TYPE: RETAIL
FORMAT: PDF RELEASE DATE: 2015.01.14
ISBN: 9783642297618 STORE DATE: 2013
SAVED.MONEY: 80 EURO DISKCOUNT: 03 x 05MB
AUTHOR: FULTZ, BRENT, HOWE, JAMES M
BOOK
This book explains concepts of transmission electron microscopy
(TEM) and x-ray diffractometry (XRD) that are important for the
characterization of materials. The fourth edition adds important
new techniques of TEM such as electron tomography, nanobeam
diffraction, and geometric phase analysis. A new chapter on
neutron scattering completes the trio of x-ray, electron and
neutron diffraction. All chapters were updated and revised for
clarity. The book explains the fundamentals of how waves and
wavefunctions interact with atoms in solids, and the similarities
and differences of using x-rays, electrons, or neutrons for
diffraction measurements. Diffraction effects of crystalline
order, defects, and disorder in materials are explained in
detail. Both practical and theoretical issues are covered. The
book can be used in an introductory-level or advanced-level
course, since sections are identified by difficulty. Each chapter
includes a set of problems to illustrate principles, and the
extensive Appendix includes laboratory exercises
